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Join the SPIE talk by Dr. Thorsten Last on “Scalable and automated cryogenic test platform for characterization of superconducting quantum processors”

24-09-2025

Meet Dr. Thorsten Last this week during the SPIE Photomask Technology and EUV Lithography (SPIE PUV) conference in Monterey, California. Join his talk on “Scalable and automated cryogenic test platform for characterization of superconducting quantum processors” to learn more about our roadmap for faster, industrial-scale quantum chip testing.

Dr. Thorsten Last shows the first OrangeQS MAX to visitors during its assembly at the OrangeQS production facility in Delft, The Netherlands.

Dr. Thorsten Last shows the first OrangeQS MAX to visitors during its assembly at the OrangeQS production facility in Delft, The Netherlands.

 

As part of Session 9: Emerging Technology, Dr. Thorsten Last, executive director at OrangeQS, talks about the transition of academic to industrial-scale systems for the characterization of quantum chips. If you are joining the SPIE PUV conference in Monterey, California, make sure to read the abstract below and add his talk to your schedule.

 

Scalable and automated cryogenic test platform for characterization of superconducting quantum processors (Invited Paper)

24 September 2025 | 1:30 PM – 1:50 PM PDT | Monterey Conf. Ctr., Steinbeck 2

 

Quantum computing based on superconducting integrated circuits is entering a pivotal phase, transitioning from fundamental R&D to early-stage technology scaling and industrial implementation. In order keep a high cadence of consistently improving a quantum processor towards potential quantum advantage, qubit manufacturing needs to be complemented by high-throughput test and metrology in a tight feedback loop. Here we present an industry-first, automated test system addressing the critical requirement of cryogenic high-throughput testing of superconducting quantum processors. This automated test system is designed to characterize 150-qubit scale devices within a one- to two-week cycle. It supports measurement and extraction of parameters across multiple domains: read-out circuits, individual transmon properties, tunable couplers, and nearest-neighbor DC and microwave crosstalk. The test system also accesses thermal parameters in addition to qubit characteristics allowing the identification and mitigation of thermal decoherence channels as system complexity grows. To that end, we will present temperature-dependent experiments, focusing on qubit coherence and effective temperature.

 

The talk covers why and how OrangeQS tackles the test bottleneck in QPU development, shares our roadmap for industrial scale quantum chip testing and dives into the technology behind our first OrangeQS MAX system.

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